- Operating Temperature :
- Logic Type :
-
- 1:1, 1:2 Configurable Registered Buffer with Parity (2)
- 1:2 Configurable Registered Buffer with Parity (2)
- 1:2 Registered Buffer with Parity (4)
- ABT Scan Test Device With Transceivers and Registers (10)
- ABT Scan Test Device With Universal Bus Transceivers (14)
- Comparator, Driver (6)
- Differential Receiver/Driver (2)
- Linking Addressable Scan Ports (4)
- LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line (2)
- Registered Buffer with SSTL_2 Compatible I/O for DDR (2)
- Scan Test Device with Registered Bus Transceiver (2)
- Scan Test Device With Transceivers And Registers (12)
- Scan Test Device with Universal Bus Transceivers (4)
- TTL/BTL Transceiver/Translator (2)
- TTL/BTL Universal Storage Transceiver (2)
- Filtre sélectionné :
72 Produits
| Photo. | Type | Prix | Quantité | Stocks | Fabricant | Description | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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|
Regarder |
2,090
On a de la marchandise.
|
Maxim Integrated | IC DCL QUAD 300MHZ ATE 80TQFP | ATE | Active | Tray | 0°C ~ 70°C | Surface Mount | 80-TQFP Exposed Pad | 80-TQFP-EP (12x12) | -1 V ~ 5.2 V | 4 | Comparator, Driver | ||
|
|
Regarder |
1,896
On a de la marchandise.
|
Maxim Integrated | IC DCL DUAL 500MBPS ATE 100TQFP | ATE | Active | Tray | 0°C ~ 70°C | Surface Mount | 100-TQFP Exposed Pad | 100-TQFP-EPR (14x14) | -1.5 V ~ 6.5 V | 2 | Comparator, Driver | ||
|
|
|
Regarder |
813
On a de la marchandise.
|
Maxim Integrated | IC COMPARATOR R-R 80TQFP | ATE | Active | Tray | 0°C ~ 70°C | Surface Mount | 80-TQFP Exposed Pad | 80-TQFP-EP (12x12) | -2.2 V ~ 5.2 V | 4 | Comparator, Driver | ||
|
|
Regarder |
1,099
On a de la marchandise.
|
Texas Instruments | IC 18-BIT TTL/BTL XCVR 100-HLQFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) | 4.5 V ~ 5.5 V | 18 | TTL/BTL Universal Storage Transceiver | ||
|
|
|
Regarder |
2,008
On a de la marchandise.
|
Texas Instruments | IC 17BIT UNIV STRG XCVR 100HLQFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) | 4.5 V ~ 5.5 V | 17 | LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line | ||
|
|
Regarder |
3,509
On a de la marchandise.
|
Texas Instruments | IC TXRX 8BIT TTL/BTL 52-QFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.5 V ~ 5.5 V | 8 | TTL/BTL Transceiver/Translator | ||
|
|
Regarder |
3,479
On a de la marchandise.
|
Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
Regarder |
2,075
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Regarder |
3,173
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Regarder |
2,859
On a de la marchandise.
|
Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
|
|
Regarder |
1,966
On a de la marchandise.
|
Texas Instruments | NON-STANDARD PART CALL FIRST | - | Active | Tray | - | - | - | - | - | - | - | ||
|
|
|
Regarder |
728
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Regarder |
2,042
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
Regarder |
2,813
On a de la marchandise.
|
Texas Instruments | IC LINK ADDRSS SCAN-PORT 64-BGA | 74LVT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LFBGA | 64-BGA MICROSTAR (8x8) | 2.7 V ~ 3.6 V | - | Linking Addressable Scan Ports | ||
|
|
|
Regarder |
737
On a de la marchandise.
|
Texas Instruments | IC 20BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
Regarder |
2,457
On a de la marchandise.
|
IDT, Integrated Device Technology Inc | IC BUFFER 14BIT REG DDR2 150-BGA | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 150-TFBGA | 150-CABGA (8x13) | 1.7 V ~ 1.9 V | 14 | 1:2 Registered Buffer with Parity | ||
|
|
Regarder |
2,006
On a de la marchandise.
|
IDT, Integrated Device Technology Inc | IC BUFFER 28BIT 1:2 REG 160-BGA | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 160-LFBGA | 160-CABGA (9x13) | 1.7 V ~ 1.9 V | 28 | 1:2 Registered Buffer with Parity | ||
|
|
Regarder |
2,429
On a de la marchandise.
|
IDT, Integrated Device Technology Inc | IC BUFFR 28BIT REG DDR2 176-BGA | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 176-TFBGA | 176-CABGA (6x15) | 1.7 V ~ 1.9 V | 28 | 1:2 Configurable Registered Buffer with Parity | ||
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|
|
Regarder |
2,716
On a de la marchandise.
|
IDT, Integrated Device Technology Inc | IC BUFFER 25BIT REG DDR2 96-BGA | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-CABGA (13.5x5.5) | 1.7 V ~ 1.9 V | 25, 14 | 1:1, 1:2 Configurable Registered Buffer with Parity | ||
|
|
Regarder |
2,480
On a de la marchandise.
|
IDT, Integrated Device Technology Inc | IC BUFFER DDR 13-26BIT 56VFQFPN | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 56-VFQFN Exposed Pad | 56-VFQFPN (8x8) | 2.3 V ~ 2.7 V | 13, 26 | Registered Buffer with SSTL_2 Compatible I/O for DDR | ||
|
|
Regarder |
763
On a de la marchandise.
|
ON Semiconductor | IC RCVR/DRVR HEX DIFF ECL 32LQFP | 100EP | Active | Tray | -40°C ~ 85°C | Surface Mount | 32-LQFP | 32-LQFP (7x7) | 3 V ~ 5.5 V | 6 | Differential Receiver/Driver | ||
|
|
|
Regarder |
1,771
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Regarder |
3,544
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
Regarder |
2,346
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
Regarder |
3,989
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
Regarder |
1,253
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
Regarder |
1,851
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
Regarder |
1,952
On a de la marchandise.
|
Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Regarder |
854
On a de la marchandise.
|
Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Regarder |
3,631
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers |
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